質(zhì)量方針

全員參與、高效創(chuàng)新、客戶滿意、芯系未來(lái)。

產(chǎn)品高可靠性
ReferenceTest Condition

Duratio

Lots

S. S

(pcs

Accept Criteria

JESD22-A113

J-STD-02

Preconditioning (MSL 3):

Moisture Preconditioning + 3 x reflow:

UHAST/TC/PC/HAS

N/A

1308

0 Fail

JESD22-A104

Temperature Cycle:

-55℃/150℃

1000cy177

0 Fail

JESD22-A103

High Temperature Storage:

150

1000hrs177

0 Fail

JESD22-A118

Ubias Highly Accelerated Stress Test:

130℃/85%RH/33.3psia

96hrs177

0 Fail

JESD22-A110

Highly Accelerated Stress Test:

130℃/85%RH/Bias=100V

96hrs177

0 Fail

JESD22-A122

Power Cycle:

-25℃/150℃/ΔTvj=100℃

10000cy177

0 Fail

JESD22-A108

High Temp Gate Bias:

150℃/6V VGS

1000hrs

177

0 Fail

JESD22-A10

High Temp Reverse Bias

150℃/520V VD

1000hrs177

0 Fail

JS-001-2014

Human Body Model ESDN/A13

0 Fail

JS-001-2014

Charged Device Model ESD

N/A13

0 Fail